Multiple scattering correction factor estimation for aethalometer aerosol absorption coefficient measurement

We estimate the multiple scattering correction factor (Cref), which is an empirical constant required to correct aerosol absorption coefficient (σap) measurements for the multiple scattering artifacts of aethalometer, using a multiplier derived from a linear regression method (CrefLRL). Estimated CrefLRL values during the Cheju ABC Plume Monsoon EXperiment (CAPMEX) are 3.99 (405 nm), 4.48 (532 nm), and 5.46 (781 nm) using aethalometer and 3-wavelength PhotoAcoustic Soot Spectrometer (PASS-3). The difference between these CrefLRL values and those of a previous study (CrefW03) are ˗8.0% (405 nm), 20.1% (532 nm), and 30.2% (781 nm); the difference is greater at larger wavelengths because the linear regression line intercept is larger. CrefW03 varies by up to 121% with increasing aerosol absorption coefficient (σap) at 532 and 781 nm, whereas CrefLRL varies by only 36.8%. CrefW03 and CrefLRL…